[B-8-1] Analysies of the Radiation Caused Characteristics Change in SOI MOSFETS Using Field Shield Isolation

Y. Hirano, S. Maeda, W. Fernandez, T. Iwamatsu, Y. Yamaguchi, S. Maegawa, T. Nishimura (1.ULSI Development Center, Mitsubishi Electric Corporation)

https://doi.org/10.7567/SSDM.1998.B-8-1