[A-1-5] Stress Induced Subthreshold Current Hump in Short Gate-Length pMOSFET's with Shallow Trench Isolation
L. P. Chiang、L. Y. Huang、N. K. Zous、Tahui Wang
(1.Department of Electronics Engineering, National Chiao-Tung University)
https://doi.org/10.7567/SSDM.1999.A-1-5
