[A-2-2] Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs

Nobuyuki Sano、Kenji Natori、Kazuya Matsuzawa、Mikio Mukai (1.Institute of Applied Physics, University of Tsukuba、2.Semiconductor Technology Academic Research Center (STARC))

https://doi.org/10.7567/SSDM.1999.A-2-2