[A-6-3] New Stand-By Degradation Mode in n-MOSFET's with Thin Gate Oxide Hiroyuki Tanaka, Hirofumi Shinohara, Hidetsugu Uchida, Jiro Ida (1.Device Business Group, Oki Electric Industry Co., Ltd.) https://doi.org/10.7567/SSDM.1999.A-6-3
