[B-1-2] Dependence of Sub-Threshold Hump and RNWE Characteristics on the Gate Length by TED

Jong-Wan Jung、Jong-Min Kim、Jeong-Hwan Son、Shin-Young Chung、Young-Jong Lee、Hyun-Cheol Kim、Kyung-Ho Lee (1.LG Semicon Co., Ltd.)

https://doi.org/10.7567/SSDM.1999.B-1-2