[B-1-2] Dependence of Sub-Threshold Hump and RNWE Characteristics on the Gate Length by TED

Jong-Wan Jung, Jong-Min Kim, Jeong-Hwan Son, Shin-Young Chung, Young-Jong Lee, Hyun-Cheol Kim, Kyung-Ho Lee (1.LG Semicon Co., Ltd.)

https://doi.org/10.7567/SSDM.1999.B-1-2