[B-11-2] Thorough Investigation of Kink-Related Excess Noise in Deep Submicron SOI N-MOSFETs on Unibond Substrate

S. Haendler、J. Jomaah、F. Balestra、J. L. Pelloie、C. Raynaud、J. Boussey (1.LPCS/ENSERG (UMR CNRS/INPG)、2.LETI-CEA (DMEL/CENG))

https://doi.org/10.7567/SSDM.1999.B-11-2