[B-11-2] Thorough Investigation of Kink-Related Excess Noise in Deep Submicron SOI N-MOSFETs on Unibond Substrate

S. Haendler, J. Jomaah, F. Balestra, J. L. Pelloie, C. Raynaud, J. Boussey (1.LPCS/ENSERG (UMR CNRS/INPG), 2.LETI-CEA (DMEL/CENG))

https://doi.org/10.7567/SSDM.1999.B-11-2