[B-6-2] Device Performances Improvement Based on TED Suppression in Deep Sub-Quarter Micron Regime
Hyun-Sik Kim, Jong-Hyon Ahn, Duk-Min Lee, Soo-Cheol Lee, Kwang-Pyuk Suh
(1.CPU Tech. Team, Samsung Electronics Co, Ltd.)
https://doi.org/10.7567/SSDM.1999.B-6-2
