[C-13-2] Performance and Reliability of 0.35 μm/0.25 μm HIMOS R Technology for Embedded Flash Memory Applications

D. Wellekens、J. Van Houdt、P. Verheyen、J. Frisson、M. Lorenzini、G. Xue、H. E. Maes (1.IMEC)

https://doi.org/10.7567/SSDM.1999.C-13-2