[C-13-2] Performance and Reliability of 0.35 μm/0.25 μm HIMOS R Technology for Embedded Flash Memory Applications

D. Wellekens, J. Van Houdt, P. Verheyen, J. Frisson, M. Lorenzini, G. Xue, H. E. Maes (1.IMEC)

https://doi.org/10.7567/SSDM.1999.C-13-2