[B-1-3] The Impact for Gate Oxide Scaling (32A-12A) and Power Supply for Sub-0.1 μm CMOSFETs
W. K. Yeh, C. Y. Lin, S. M. Cheng, C. T. Huang, H. H. Shih, J. K. Chen, F. T. Liou
(1.United Microelectronics Corp., Logic Technology Department, Technology & Process Development Division)
https://doi.org/10.7567/SSDM.2000.B-1-3