[D-2-4] Structural and Electrical Characterization of Nanocrystalline Silicon (nc-Si) Single Electron Transistors

Y. T. Tan、T. Kamiya、Z. A. K. Durrani、H. Ahmed I. Shimizu (1.Microelectronics Research Center, Cavendish Laboratory, University of Cambridge、2.CREST、3.Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.2000.D-2-4