[E-1-3] C-V Characteristics of ZnO Thin-Film Field Effect Transistor Structures Formed on Glass Substrates

Y. Ohmaki, S. Kishimoto, Y. Ohno, F. Matsukura, H. Ohno, K. Saikusa, T. Aita, A. Ohtomo, M. Kawasaki (1.Laboratory for Electronic Intelligent Systems, Research Institute of Electric Communication Tohoku University, 2.Department of Innovative and Engineered Materials, Tokyo Institute of Technology)

https://doi.org/10.7567/SSDM.2000.E-1-3