[B-2-2] Interconnect Length Distribution in Si System ULSI
Naohiro Takagi, Hiyouko Shinoki, Tomohito Tsushima, Yoshisato Yokoyama, Kazuya Masu
(1.Precision and Intelligence Laboratory, Tokyo Institute of Technology)
https://doi.org/10.7567/SSDM.2001.B-2-2