[B-4-5] Current-Voltage Charactreistics of Gate Oxides after Hard Breakdown
Twan Bearda、Pierre H. Woerlee、Hans Wallinga、Paul W. Mertens、Marc M. Heyns
(1.Interuniversitary Micro-Electronics Center、2.University of Twente)
https://doi.org/10.7567/SSDM.2001.B-4-5