[C-6-6] Anomalous Noise Degradation Caused by Device Size Effects in SOI MOSFETs

Hyeokjae Lee、Kwun-Soo Chun、Jong Ho Lee、Young June Park、Hong Shick Min (1.School of Electrical Engineering and Computer Science, Seoul National University、2.School of Electrical Engineering, Wonkwang University)

https://doi.org/10.7567/SSDM.2001.C-6-6