Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure

Franz Schuler; Georg Tempel; Hanno Melzner; Paul Hendrickx; Dirk Wellekens; Martino Lorenzini; Jan Van Houdt

doi:https://doi.org/10.7567/SSDM.2001.C-9-4

[C-9-4] Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure

Franz Schuler、Georg Tempel、Hanno Melzner、Paul Hendrickx、Dirk Wellekens、Martino Lorenzini、Jan Van Houdt (1.Infineon Technologies AG、2.IMEC vzw.、3.Kapeldreef 75、4.Otto-Hahn-Ring)

https://doi.org/10.7567/SSDM.2001.C-9-4

2001 International Conference on Solid State Devices and Materials

[C-9-4] Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure