[C-9-4] Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure
Franz Schuler, Georg Tempel, Hanno Melzner, Paul Hendrickx, Dirk Wellekens, Martino Lorenzini, Jan Van Houdt
(1.Infineon Technologies AG, 2.IMEC vzw., 3.Kapeldreef 75, 4.Otto-Hahn-Ring)
https://doi.org/10.7567/SSDM.2001.C-9-4