[D-2-5] Origin of Critical Substrate Bias in Variable Threshold Voltage CMOS
Takashi Inukai, Hyunsik Im, Toshiro Hiramoto
(1.Institute of Industrial Science, University of Tokyo, 2.VLSI Design and Education Center, University of Tokyo)
https://doi.org/10.7567/SSDM.2001.D-2-5