[E-4-2] DC Characteristics of InP HBTs under High-Temperature and Bias Stress Kenji Kurishima、Minoru Ida、Noriyuki Watanabe、Hiroki Nakajima、Yasuro Yamane、Eiichi Sano (1.NTT Photonics Laboratories) https://doi.org/10.7567/SSDM.2001.E-4-2