[E-5-2] Robust 0.13-μm Gate HJFET with Low Fringing Capacitance
Takashi Inoue、Akio Wakejima、Katsumi Yamanoguchi、Norihiko Samoto
(1.Photonic and Wireless Devices Research Labs.、2.R&D Technical Support Center, NEC Corporation)
https://doi.org/10.7567/SSDM.2001.E-5-2