[P-1-6] Comprehensive Study on Reliability of Low-Temperature Poly-Si TFTs under Dynamic CMOS Operations
Yukiharu Uraoka, Hiroshi Yano, Tomoaki Hatayama, Takashi Fuyuki
(1.Nara Institute of Science and Technology, Material Science)
https://doi.org/10.7567/SSDM.2001.P-1-6
