[A-2-3] Statistical Modeling of MOS Devices for Parametric Yield Prediction

Juin J. Liou、Qiang Zhang、John McMacken、J. Ross Thomson、Kevin Stiles、Paul Layman (1.School of EE and CS, University of Central Florida、2.Modeling and Simulation Group, Agere Systems)

https://doi.org/10.7567/SSDM.2002.A-2-3