Statistical Modeling of MOS Devices for Parametric Yield Prediction

Juin J. Liou; Qiang Zhang; John McMacken; J. Ross Thomson; Kevin Stiles; Paul Layman

doi:https://doi.org/10.7567/SSDM.2002.A-2-3

2002 International Conference on Solid State Devices and Materials

Sep 17, 2002 - Sep 19, 2002
Nagoya Congress Center, Nagoya, Japan

[A-2-3] Statistical Modeling of MOS Devices for Parametric Yield Prediction

Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman (1.School of EE and CS, University of Central Florida, 2.Modeling and Simulation Group, Agere Systems)

https://doi.org/10.7567/SSDM.2002.A-2-3

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