[A-5-2] Enhanced Tunneling Current Effect for Nonvolatile Memory Applications

Bogdan Govoreanu, Pieter Blomme, Jan Van Houdt, Kristin De Meyer (1.IMEC Leuven, STDI Division, 2.KU Leuven, ESAT-INSYS)

https://doi.org/10.7567/SSDM.2002.A-5-2