[A-5-2] Enhanced Tunneling Current Effect for Nonvolatile Memory Applications

Bogdan Govoreanu、Pieter Blomme、Jan Van Houdt、Kristin De Meyer (1.IMEC Leuven, STDI Division、2.KU Leuven, ESAT-INSYS)

https://doi.org/10.7567/SSDM.2002.A-5-2