[A-6-3] Hot Carrier Enhanced Read Disturb and Scaling Effects in a Localized Trapping Storage SONOS Type Flash Memory Cell

W. J. Tsai、C. C. Yeh、N. K. Zous、C. C. Liu、S. K. Cho、C. H. Chen、Tahui Wang、Sam Pan、Chih-Yuan Lu (1.Macronix International Co., Ltd.、2.Department of Electronics Engineering, National Chiao-Tung University)

https://doi.org/10.7567/SSDM.2002.A-6-3