[A-7-3] Impact of Burn-In Stress on Reliability of High Density DRAMs Il-Gweon Kim、Jun-Hyun Chun、Nam-Sung Kim、Young-Woo Kwon、Se-Kyoung Choi、Joo-Seog Park (1.Memory R&D Division, Hynix Semiconductor Inc.) https://doi.org/10.7567/SSDM.2002.A-7-3
