[A-7-3] Impact of Burn-In Stress on Reliability of High Density DRAMs Il-Gweon Kim, Jun-Hyun Chun, Nam-Sung Kim, Young-Woo Kwon, Se-Kyoung Choi, Joo-Seog Park (1.Memory R&D Division, Hynix Semiconductor Inc.) https://doi.org/10.7567/SSDM.2002.A-7-3
