[C-7-4] Bias and Temperature Dependent Reliability Issues in a 0.18um Generation CMOS Multi-Oxide SoC Technology

S.-J. Chen、C.-C. Lin、S. S. Chung、J.-C. Lin、C.-H. Chu (1.Department of Electronic Engineering, National Chiao Tung University、2.UMC)

https://doi.org/10.7567/SSDM.2002.C-7-4