[C-7-4] Bias and Temperature Dependent Reliability Issues in a 0.18um Generation CMOS Multi-Oxide SoC Technology

S.-J. Chen, C.-C. Lin, S. S. Chung, J.-C. Lin, C.-H. Chu (1.Department of Electronic Engineering, National Chiao Tung University, 2.UMC)

https://doi.org/10.7567/SSDM.2002.C-7-4