[D-2-2] The Issues and Reliability of High Density FeRAMs

Keum Hwan Noh、Beelyong Yang、Seok Won Lee、Seaung-Suk Lee、Hee-Bok Kang、Young-Ji Park (1.New Device Team, Memory R&D Division, Hynix Semiconductor Inc.)

https://doi.org/10.7567/SSDM.2002.D-2-2