The Japan Society of Applied Physics

[D-2-2] The Issues and Reliability of High Density FeRAMs

Keum Hwan Noh, Beelyong Yang, Seok Won Lee, Seaung-Suk Lee, Hee-Bok Kang, Young-Ji Park (1.New Device Team, Memory R&D Division, Hynix Semiconductor Inc.)

https://doi.org/10.7567/SSDM.2002.D-2-2