The Issues and Reliability of High Density FeRAMs

Keum Hwan Noh; Beelyong Yang; Seok Won Lee; Seaung-Suk Lee; Hee-Bok Kang; Young-Ji Park

doi:https://doi.org/10.7567/SSDM.2002.D-2-2

2002 International Conference on Solid State Devices and Materials

Sep 17, 2002 - Sep 19, 2002
Nagoya Congress Center, Nagoya, Japan

[D-2-2] The Issues and Reliability of High Density FeRAMs

Keum Hwan Noh, Beelyong Yang, Seok Won Lee, Seaung-Suk Lee, Hee-Bok Kang, Young-Ji Park (1.New Device Team, Memory R&D Division, Hynix Semiconductor Inc.)

https://doi.org/10.7567/SSDM.2002.D-2-2

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