Impact of SiC Structural Crystal Defects on the Electrical Performance of Bipolar PN Junction Diode

R. K. Malhan; H. Nakamura; S. Onda; D. Nakamura; K. Hara

doi:https://doi.org/10.7567/SSDM.2002.G-6-4

2002 International Conference on Solid State Devices and Materials

Sep 17, 2002 - Sep 19, 2002
Nagoya Congress Center, Nagoya, Japan

[G-6-4] Impact of SiC Structural Crystal Defects on the Electrical Performance of Bipolar PN Junction Diode

R. K. Malhan, H. Nakamura, S. Onda, D. Nakamura, K. Hara (1.Research Laboratories, DENSO CORPORATION, 2.Toyota Central Research and Development Laboratories, Inc.)

https://doi.org/10.7567/SSDM.2002.G-6-4

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