[LB-1-1] Analysis of Transconductance Degradation after Endurance Cycling of Uniform F-N Flash Memories

Y. Moriyama、K. Takahashi、K. Ueda、M. Kusumi、K. Sato、I. Matsuo (1.ULSI Process Technology Development Center, Matsushita Electric Industrial Co., Ltd.)

https://doi.org/10.7567/SSDM.2002.LB-1-1