[P2-4] Influence of Gate-to-Source Tunneling Current on Hot-Carrier Reliability Testing in MOSFETs with Ultra-Thin Gate Oxide
Jone F. Chen, Chih-Pin Tsao, T.-C. Ong
(1.Department of Electrical Engineering and Institute of Microelectronics, National Cheng Kung University, 2.Logic Technology Division, TSMC)
https://doi.org/10.7567/SSDM.2002.P2-4
