[P2-7] Second Breakdown of 18V GGNMOS induced by Kirk Effect Under ESD Byung-Chul Jeon, Seung-Chul Lee, Min-Koo Han (1.#50,301-1115, School of Electrical Eng., Seoul Nat'l Univ.) https://doi.org/10.7567/SSDM.2002.P2-7
