[P5-1] Reduced Gate Leakage in AlGaAs/InGaAs pHEMTs by a Si3N4 Sidewall Planarized Process Cheng-Kuo Lin, Wen-Kai Wang, Yi-Jen Chan (1.Department of Electrical Engineering, National Central University) https://doi.org/10.7567/SSDM.2002.P5-1