[A-2-2] New Mechanism for Negative-Bias-Temperature Instability and Its Impact on Scaling of pMOSFETs

Da-Yuan Lee, Horng-Chih Lin, Chi-Chun Chen, Chao-Hsin Chien, Tiao-Yuan Huang, Tahui Wang, Tze-Liang Lee, Shih-Chang Chen, Mong-Song Liang (1.Institute of Electronics, National Chiao-Tung University, 2.National Nano Device Laboratories, 3.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2003.A-2-2