[A-2-3] Origin of Enhanced Thermal Noise for 100nm-MOSFETs

S. Hosokawa, Y. Shiraga, H. Ueno, M. Miura-Mattausch, H.J. Mattausch, T. Ohguro, S. Kumashiro, M. Taguchi, H. Masuda, S. Miyamoto (1.Graduate School of Advanced Sciences of Matter, 2.Research Center for Nanodevices and Systems, Hiroshima University, 3.Semiconductor Technology Academic Research Center)

https://doi.org/10.7567/SSDM.2003.A-2-3