[A-8-2] Experimental Evidence of Gate-Induced Schottky Barrier Height Lowering due to Image Force in Gated Schottky Diodes A. Kinoshita、K. Uchida、J. Koga (1.Advanced LSI Technology Laboratory, Toshiba Corp.) https://doi.org/10.7567/SSDM.2003.A-8-2
