Intelligent BSIM4 Model Parameter Extraction for Sub-100 nm MOSFETs era

Yiming Li; Yen-Yu Cho

doi:https://doi.org/10.7567/SSDM.2003.A-8-3

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[A-8-3] Intelligent BSIM4 Model Parameter Extraction for Sub-100 nm MOSFETs era

Yiming Li、Yen-Yu Cho (1.Department of Nano Device Technology, National Nano Device Laboratories、2.Microelectronics and Information Systems Research Center, National Chiao Tung University、3.Department of Computer and Information Science, National Chiao Tung University)

https://doi.org/10.7567/SSDM.2003.A-8-3

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