[D-4-4] Temperature Dependence of Threshold Voltage and Hot Carrier Degradation of Dynamic Threshold SOI-pMOSFETs

Yao-Jen Lee、Tien-Sheng Chao、Chun-Yang Huang、Horng-Chih Lin、Tiao-Yuan Huang (1.Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University、2.Department of Electrophysics, National Chiao Tung University、3.National Nano Device Labs.)

https://doi.org/10.7567/SSDM.2003.D-4-4