[D-4-4] Temperature Dependence of Threshold Voltage and Hot Carrier Degradation of Dynamic Threshold SOI-pMOSFETs

Yao-Jen Lee, Tien-Sheng Chao, Chun-Yang Huang, Horng-Chih Lin, Tiao-Yuan Huang (1.Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 2.Department of Electrophysics, National Chiao Tung University, 3.National Nano Device Labs.)

https://doi.org/10.7567/SSDM.2003.D-4-4