[G-4-1] 3D System Integration by Chip-to-Wafer Stacking Technologies
Peter Ramm、Armin Klumpp、Reinhard Merkel、Josef Weber、Robert Wieland、Gunter Elst
(1.Fraunhofer Institute for Reliability and Microintegration, Munich Division、2.Fraunhofer Institute for Integrated Circuits, Dresden Division)
https://doi.org/10.7567/SSDM.2003.G-4-1