The Japan Society of Applied Physics

2003 International Conference on Solid State Devices and Materials

2003 International Conference on Solid State Devices and Materials

Sep 16, 2003 - Sep 18, 2003
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[P11-5L] Dynamic Thermal Characterization and Modeling of Silicon Bipolar Junction Transistors using Pulsed RF Measurement System

Guo-Wei Huang, An-Sam Peng, Kun-Ming Chen, Li-Hsin Chang (1.National Nano Device Laboratories)

https://doi.org/10.7567/SSDM.2003.P11-5L