[P11-5L] Dynamic Thermal Characterization and Modeling of Silicon Bipolar Junction Transistors using Pulsed RF Measurement System
Guo-Wei Huang、An-Sam Peng、Kun-Ming Chen、Li-Hsin Chang
(1.National Nano Device Laboratories)
https://doi.org/10.7567/SSDM.2003.P11-5L
