[P2-1] Efficient Improvement of Hot-Carrier-Induced Degradation for Sub-0.1μm CMOSFET

Chieh-Ming Lai、Chia-Che Hu、Jung-Chun Lin、Shing-Tai Pan、Wen-Kuan Yeh (1.Institute of Microelectronics, National Cheng Kung University、2.Department of Computer Science Information Engineering, Shu-Te University、3.Department of Electrical Engineering, National Chiao-Tung University、4.Department of Electrical Engineering, National University of Kaohsiung)

https://doi.org/10.7567/SSDM.2003.P2-1