[P2-1] Efficient Improvement of Hot-Carrier-Induced Degradation for Sub-0.1μm CMOSFET

Chieh-Ming Lai, Chia-Che Hu, Jung-Chun Lin, Shing-Tai Pan, Wen-Kuan Yeh (1.Institute of Microelectronics, National Cheng Kung University, 2.Department of Computer Science Information Engineering, Shu-Te University, 3.Department of Electrical Engineering, National Chiao-Tung University, 4.Department of Electrical Engineering, National University of Kaohsiung)

https://doi.org/10.7567/SSDM.2003.P2-1